IEC PAS 62137-3:2008

Electronics assembly technology - Selection guidance of environmental and endurance test methods for solder joints

OVERVIEW

IEC/PAS 62137-3:2008(E) describes the selection of an appropriate test method for reliability test of solder joints for various shapes and types of surface mount devices (SMD) and leaded devices, including various types of solder material.

COMMENTS

-

PRODUCT DETAILS

Status
Edition 2008
No. of Pages 41
ICS Classification 31.190 Electronic component assemblies
Committee TC 91
Available for Purchase For sale in Singapore only
Adoption IEC : 0