IEC 62132-2:2010

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

OVERVIEW

IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2010
No. of Pages 49
ICS Classification 31.200 Integrated circuits. Microelectronics
Committee TC 47/SC 47A
Available for Purchase For sale in Singapore only
Adoption IEC