IEC TS 63202-2:2021
Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
OVERVIEW
IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2021 |
| No. of Pages | 19 |
| ICS Classification | 27.160 Solar energy engineering |
| Committee | TC 82 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |