ISO 18452:2005
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
OVERVIEW
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2005 |
| No. of Pages | 9 |
| ICS Classification | 81.060.30 Advanced ceramics |
| Committee | ISO/TC 206 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |