IEC TS 62916:2017
Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
OVERVIEW
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2017 |
| No. of Pages | 13 |
| ICS Classification | 27.160 Solar energy engineering |
| Committee | TC 82 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |