SS IEC 60749-3:2025
Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination
OVERVIEW
The purpose of this part of SS IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2025 |
| No. of Pages | 17 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | Electrical and Electronic Standards Committee |
| Available for Purchase | Global |
| Adoption | IEC 60749-3 : 2017 IDT |