SS IEC 60749-1:2025
Semiconductor devices – Mechanical and climatic test methods – Part 1: General
OVERVIEW
This part of SS IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
In the case of contradiction between this standard and a relevant procurement specification, the latter should govern.
COMMENTS
-
PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2025 |
| No. of Pages | 14 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | Electrical and Electronic Standards Committee |
| Available for Purchase | Global |
| Adoption | IEC 60749-1 : 2002 IDT |