IEC 63011-2:2018

Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect

OVERVIEW

IEC 63011-2:2018 provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2018
No. of Pages 28
ICS Classification 31.200 Integrated circuits. Microelectronics
Committee TC 47/SC 47A
Available for Purchase For sale in Singapore only
Adoption IEC