ISO/IEC 19510:2013
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
OVERVIEW
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2013 |
| No. of Pages | 507 |
| ICS Classification | 35.020 Information technology (IT) in general |
| Committee | ISO/IEC JTC 1 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |