ISO 17297:2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
OVERVIEW
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2025 |
| No. of Pages | 14 |
| ICS Classification | 01.040.71 Chemical technology (Vocabularies) 71.040.50 Physicochemical methods of analysis |
| Committee | ISO/TC 202/SC 1 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO : 0 |