IEC 62528:2007

Standard Testability Method for Embedded Core-based Integrated Circuits

OVERVIEW

Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2007
No. of Pages 125
ICS Classification 31.200 Integrated circuits. Microelectronics
Committee TC 91
Available for Purchase For sale in Singapore only
Adoption IEC