IEC 62132-4:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

OVERVIEW

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2006
No. of Pages 49
ICS Classification 31.200 Integrated circuits. Microelectronics
Committee TC 47/SC 47A
Available for Purchase For sale in Singapore only
Adoption IEC