ISO 20263:2017
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
OVERVIEW
ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.
COMMENTS
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PRODUCT DETAILS
| Status | Withdrawn - 06 Jan 2026 |
|---|---|
| Edition | 2017 |
| No. of Pages | 45 |
| ICS Classification | 37.020 Optical equipment 71.040.50 Physicochemical methods of analysis |
| Committee | ISO/TC 202/SC 3 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |