IEC 61649:1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
OVERVIEW
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
COMMENTS
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PRODUCT DETAILS
| Status | Revised |
|---|---|
| Edition | 1997 |
| No. of Pages | 31 |
| ICS Classification | 03.120.30 Application of statistical methods 03.120.01 Quality in general |
| Committee | TC 56 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |