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302 publications found under ""

SS IEC 60749-1:2025 [Current]

Semiconductor devices – Mechanical and climatic test methods – Part 1: General

SS IEC 60749-3:2025 [Current]

Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination

IEC 60050-521:1984 [Revised]

International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

IEC 60050-521:2002/AMD1:2017 [Current]

Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

IEC 60050-521:2002/AMD2:2018 [Current]

Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

IEC 60148A:1974 [Current]

First supplement - Letter symbols for semiconductor devices and integrated microcircuits

IEC 60191-1:1966 [Revised]

Mechanical standardization of semiconductor devices. Part 1: Preparation of drawings of semiconductor devices

IEC 60191-1:2007 [Revised]

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices

IEC 60191-1:2018 [Current]

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices

IEC 60191-1A:1969 [Revised]

Mechanical standardization of semiconductor devices - Part 1: Preparation of drawings of semiconductor devices - First supplement

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