FAQs
IEC 60747-16-5:2013
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-4:2004
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
IEC 60747-16-4:2004/AMD1:2009
Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
IEC 60747-16-10:2004
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave...
IEC 60444-7:2004
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency...
IEC 60444-6:2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence...
IEC 60444-5:1995
Measurement of quartz crystal units parameters - Part 5: Methods for the determination of...
IEC TR 60444-4:1988
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4:...
IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2:...