FAQs
IEC 62258-2:2011
Semiconductor die products - Part 2: Exchange data formats
IEC 62258-1:2009
Semiconductor die products - Part 1: Procurement and use
IEC 60749-8:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
IEC 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture...
IEC 60749-42:2014
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and...
IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test...
IEC 60749-39:2006
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture...
IEC 60749-38:2008
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method...
IEC 60749-37:2008
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test...
