FAQs
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady...
IEC 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for...
IEC 60749-34:2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
IEC 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture...
IEC 60749-32:2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of...
IEC 60749-32:2002/AMD1:2010
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32:...
IEC 60749-31:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of...
IEC 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
IEC 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge...
