FAQs
IEC 60749-4:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp...
IEC 60749-4:2002
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state,...
IEC 60749-30:2005
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of...
IEC 60749-30:2005/AMD1:2011
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30:...
IEC 60749-3:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 3: External...
IEC 60749-3:2002
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual...
IEC 60749-26:2013
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge...
IEC 60749-20:2008
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic...
IEC 60749-20-1:2009
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing,...
