IEC 60749-4:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
OVERVIEW
Modification of the validity date: now put at 2007.
COMMENTS
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PRODUCT DETAILS
| Status | Revised |
|---|---|
| Edition | 2003 |
| No. of Pages | 0 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |