IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
OVERVIEW
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2002 |
| No. of Pages | 15 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC |