IEC 60749-17:2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
OVERVIEW
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
COMMENTS
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PRODUCT DETAILS
| Status | Revised |
|---|---|
| Edition | 2003 |
| No. of Pages | 11 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |