IEC 60749:1984/AMD2:1993
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
OVERVIEW
COMMENTS
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PRODUCT DETAILS
| Status | Revised |
|---|---|
| Edition | 1993 |
| No. of Pages | 31 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |