IEC 60749:1996
Semiconductor devices - Mechanical and climatic test methods
OVERVIEW
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
COMMENTS
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PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 1996 |
| No. of Pages | 95 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |