ISO 11938:2012
Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
OVERVIEW
This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method,
the calibration method, the correlation method and the matrix correction method.
COMMENTS
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PRODUCT DETAILS
| Status | Current |
|---|---|
| Edition | 2012 |
| No. of Pages | 10 |
| ICS Classification | 71.040.50 Physicochemical methods of analysis |
| Committee | ISO/TC 202/SC 2 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |