IEC PAS 62171:2000
Guidelines for particle impact noise detection (PIND) testing, operator training and certification
OVERVIEW
Aims at disseminating and sharing the relevant information on PIND testing to all interested parties. The concepts and materials presented here primarily deal with most of the cause factors that affect the "Measurement Variability" pertinent to PIND and how to control them.
COMMENTS
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PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 2000 |
| No. of Pages | 41 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |