IEC PAS 62206:2000
Power and temperature cycling
OVERVIEW
Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.
COMMENTS
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PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 2000 |
| No. of Pages | 5 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |