IEC PAS 62186:2000
Mechanical shock test method
OVERVIEW
This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. It is normally applicable to cavity-type packages.
COMMENTS
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PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 2000 |
| No. of Pages | 3 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |