IEC PAS 62205:2000
High temperature storage life
OVERVIEW
Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.
COMMENTS
-
PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 2000 |
| No. of Pages | 3 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |