IEC PAS 62336:2002
Accelerated Moisture Resistance - Unbiased HAST
OVERVIEW
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
COMMENTS
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PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 2002 |
| No. of Pages | 8 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |