IEC 61189-2:1997/AMD1:2000

Amendment 1 - Test methods for electrical materials, interconnection structures and assemblies - Part 2: Test methods for materials for interconnection structures

OVERVIEW

COMMENTS

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PRODUCT DETAILS

Status Withdrawn - 02 Jan 2026
Edition 2000
No. of Pages 37
ICS Classification 31.180 Printed circuits and boards
Committee TC 91
Available for Purchase For sale in Singapore only
Adoption IEC : 0