ISO 24173:2024

Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

OVERVIEW

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

COMMENTS

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PRODUCT DETAILS

Status Current
Edition 2024
No. of Pages 40
ICS Classification 71.040.50 Physicochemical methods of analysis
Committee ISO/TC 202
Available for Purchase For sale in Singapore only
Adoption ISO : 0