ISO 24173:2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
OVERVIEW
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
COMMENTS
-
PRODUCT DETAILS
| Status | Withdrawn - 06 Jan 2026 |
|---|---|
| Edition | 2009 |
| No. of Pages | 43 |
| ICS Classification | 71.040.50 Physicochemical methods of analysis |
| Committee | ISO/TC 202 |
| Available for Purchase | For sale in Singapore only |
| Adoption | ISO |