IEC PAS 62161:2000
Steady state temperature humidity bias life test
OVERVIEW
Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
COMMENTS
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PRODUCT DETAILS
| Status | |
|---|---|
| Edition | 2000 |
| No. of Pages | 6 |
| ICS Classification | 31.080.01 Semiconductor devices in general |
| Committee | TC 47 |
| Available for Purchase | For sale in Singapore only |
| Adoption | IEC : 0 |