FAQs
IEC 60747-16-4:2004/AMD2:2017
Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
IEC 62047-29:2017
Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation...
IEC 60122-4:2019
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
IEC 60122-1:2002/AMD1:2017
Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 62047-25:2016
Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS...
IEC 62047-26:2016
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement...
IEC 62047-1:2016
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
IEC 62047-16:2015
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining...
IEC 62047-17:2015
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for...